Dependence of piezoelectric properties on layer thickness for multilayer actuators
TNO Industrie en Techniek
In general, it has been reported that the piezoelectric properties in multilayer actuators decrease for layer thicknesses below 20 microns. This has been investigated for PXE55 which is a material based on PLZT-Pb(Mg 1/2W1/2)O3 and PG01 which is a low sintering version of this material. Results show that for the standard PXE55 material the piezoelectric properties decrease for layer thicknesses below 20 micron. However for the PG01 material, sintered at a lower temperature, the piezoelectric properties do not decrease significantly for layer thicknesses down to 10 micron. Measurements of the hysteresis loops do not show a difference between the two materials. The only difference which can be observed between the two materials is the grain size. In the PXE55 material a larger grain size and a broader distribution is observed compared to the PG01 material.
To reference this document use:
4th International Conference on Electroceramics, ICE-2009, 13-17 December 2009, New Delhi, India, 115 (1), 132-141