Print Email Facebook Twitter Lifetime limitations in organic electronic devices due to metal electrochemical migration Title Lifetime limitations in organic electronic devices due to metal electrochemical migration Author Abbel, R.J. van de Peppel, L. Kirchner, G. Michels, J.J. Groen, P. Holst Centre-TNO, Eindhoven, Netherlands Max Plack Institut für Polymerenforschung, Mainz, Germany Delft University of Technology, Faculty of Aerospace Engineering, Delft, The Netherlands Publication year 2017 Abstract Operational lifetime is a critical performance parameter of organic electronic devices and can be cut short by multiple degradation mechanisms. One supposed cause is metal migration between the electrodes, which, however, is difficult to study independently of other failure modes. We present a setup, which excludes such competing processes and demonstrates that silver (Ag) electrochemical migration through organic optoelectronic materials occurs predominantly by cation transport. Metal dendrites form at the cathode, eventually causing short circuits between the electrodes. Lifetime studies with organic light-emitting diodes containing Ag electrodes suggest that results obtained with our setup can provide relevant information about degradation in real devices. Subject Nano TechnologyHOL - Holst HOL - HolstTS - Technical SciencesElectronicsIndustrial Innovation To reference this document use: http://resolver.tudelft.nl/uuid:874f3afa-c6ef-4d99-836b-168efe3be9a1 DOI https://doi.org/10.1557/mrc.2017.46 TNO identifier 781153 Source MRS Communications Document type article Files To receive the publication files, please send an e-mail request to TNO Library.