Title
Lifetime limitations in organic electronic devices due to metal electrochemical migration
Author
Abbel, R.J.
van de Peppel, L.
Kirchner, G.
Michels, J.J.
Groen, P.
Holst Centre-TNO, Eindhoven, Netherlands Max Plack Institut für Polymerenforschung, Mainz, Germany Delft University of Technology, Faculty of Aerospace Engineering, Delft, The Netherlands
Publication year
2017
Abstract
Operational lifetime is a critical performance parameter of organic electronic devices and can be cut short by multiple degradation mechanisms. One supposed cause is metal migration between the electrodes, which, however, is difficult to study independently of other failure modes. We present a setup, which excludes such competing processes and demonstrates that silver (Ag) electrochemical migration through organic optoelectronic materials occurs predominantly by cation transport. Metal dendrites form at the cathode, eventually causing short circuits between the electrodes. Lifetime studies with organic light-emitting diodes containing Ag electrodes suggest that results obtained with our setup can provide relevant information about degradation in real devices.
Subject
Nano Technology
HOL - Holst HOL - Holst
TS - Technical Sciences
Electronics
Industrial Innovation
To reference this document use:
http://resolver.tudelft.nl/uuid:874f3afa-c6ef-4d99-836b-168efe3be9a1
DOI
https://doi.org/10.1557/mrc.2017.46
TNO identifier
781153
Source
MRS Communications
Document type
article