Print Email Facebook Twitter Adhesion experiments using an AFM-Parameters of influence Title Adhesion experiments using an AFM-Parameters of influence Author Dos Santos Ferreira, O. Gelinck, E.R.M. de Graaf, D. Fischer, H. TNO Industrie en Techniek Publication year 2010 Abstract Adhesion measurements were performed by AFM (Atomic Force Microscopy). It was shown that many parameters need to be controlled in order to provide reproducible and quantitative results. Adhesion forces were shown to depend on combination of materials characteristics and testing geometry as well as experimental protocol (contact time, contact force and contact area). This contact area was modified by means of FIB (Focused Ion Beam) milling and deliberate abrasion. As a result, a drastic change in adhesion could be observed. Still, those are problems connected to adjustment of interacting surfaces. © 2010 Elsevier B.V. All rights reserved. Subject ElectronicsAbrasion tipAdhesionAFMContact areaContact timeFIBTip modificationAdhesion forcesAdhesion measurementAFMContact areasContact forcesContact timeExperimental protocolsQuantitative resultAbrasionAtomic force microscopyMaterials testingTribologyAdhesion To reference this document use: http://resolver.tudelft.nl/uuid:7ed61140-4208-41ff-98c3-db04b94eb0e3 DOI https://doi.org/10.1016/j.apsusc.2010.06.031 TNO identifier 409287 ISSN 0169-4332 Source Applied Surface Science, 257 (1), 48-55 Document type article Files To receive the publication files, please send an e-mail request to TNO Library.