Title
Chaos: the speed limiting phenomenon in dynamic atomic force microscopy
Author
Keyvani Janbahan, A.
Alijani, F.
Sadeghian Marnani, H.
Maturova, K.
Goosen, H.
van Keulen, F.
Publication year
2017
Abstract
This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the controller of AFM is tuned to be faster than a certain threshold, the closed-loop system exhibits a chaotic behavior. The presence of chaos in the closed-loop dynamics is confirmed via bifurcation diagrams, Poincaré sections, and Lyapunov exponents. Unlike the previously detected chaos due to attractive forces in the AFM, which can be circumvented via simple changes in operation parameters, this newly identified chaos is seemingly inevitable and imposes an upper limit for the closed-loop bandwidth of the AFM.
Subject
Atomic force microscopy
Lyapunov methods
Bifurcation diagram
Cartesian coordinate
Closed-loop bandwidth
Dynamic atomic force microscopy
New mathematical model
Operation parameters
Tapping-mode atomic force microscopy
Closed-loop systems
NOMI Nano Opto-Mechatronics Instruments Group
High Tech Systems & Materials
Industrial Innovation
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http://resolver.tudelft.nl/uuid:50acfa1f-4b50-411c-b1c6-1fa43b3cc558
TNO identifier
782920
Publisher
American Institute of Physics AIP
ISSN
0021-8979
Source
Journal of Applied Physics, 122 (122)
Document type
article