Title
Thermo-mechanical challenges in the longevity of micro-electronics
Author
Gielen, A.W.J.
TNO Industrie en Techniek
Publication year
2010
Abstract
Automotive electronics, solid-state-lighting, and solar cells need have to operate under harsh circumstances, either by the kind of environment they operate in, such as automotive electronics under the hood, or by the long durations of exposure. In both cases traditional lifetime assessment methods are failing: The accelaration factors, who are key to accelerated lifetime testing, are becoming to small as the operational conditions are nearing the testing conditions (automotive electronics under the hood) or are insuffiently large to obtain acceptable testing times (SSL and Solar). Trends and drivers for this are described . The some fundamental issues are presented for the mission profiles, failure and degradation mechanisms, as well as the acceleration factors. Ideas to overcome the presented limitations are shown in a combined testing-modelling scheme with some examples highlighting aspects of these ideas. ©2010IEEE.
Subject
Mechatronics, Mechanics & Materials
MIP - Materials for Integrated Products
TS - Technical Sciences
Electronics
Industrial Innovation
Accelerated lifetime testing
Acceleration factors
Automotive electronics
Degradation mechanism
Lifetime assessment
Long duration
Mission profile
Operational conditions
Testing conditions
Thermo-mechanical
Automobile parts and equipment
Degradation
Microelectronics
Microsystems
To reference this document use:
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TNO identifier
364416
ISBN
9781424470266
Source
11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010, 26-28 April 2010, Bordeaux, France
Article number
No.: 5464507
Document type
conference paper