Title
X-Ray Detector-on-Plastic with High Sensitivity Using Low Cost, Solution-Processed Organic Photodiodes
Author
Gelinck, G.H.
Kumar, A.
Moet, D.
van der Steen, J.L.P.J.
van Breemen, A.J.J.M.
Shanmugam, S.
Langen, A.
Gilot, J.
Groen, W.A.
Andriessen, H.A.J.M.
Simon, M.
Ruetten, W.
Douglas, A.U.
Raaijmakers, R.
Malinowski, P.E.
Myny, K.
Publication year
2016
Abstract
We made and characterized an X-ray detector on a 25-ìm-thick plastic substrate that is capable of medicalgrade performance. As an indirect conversion flat panel detector, it combined a standard scintillator with an organic photodetector (OPD) layer and oxide thin-film transistor backplane. Using solution-processed organic bulk heterojunction photodiode rather than the usual amorphous silicon, process temperature is reduced to be compatible with plastic film substrates, and a number of costly lithography steps are eliminated, opening the door to lower production costs. With dark currents as low as 1 pA/mm2 and sensitivity of 0.2 A/W the OPD also meets functional requirements: the proof-of-concept detector delivers high-resolution, dynamic images at 10 frames/s, and 200 pixels/in using X-ray doses as low as 3 μGy/frame. cop. 2015 IEEE.
Subject
Nano Technology
HOL - Holst
TS - Technical Sciences
Materials
Industrial Innovation
Flexible electronics
Indium-gallium-zinc oxide
IGZO
Thin-film transistor
TFT
Large-area X-ray detector
Organic photodetector
OPD
To reference this document use:
http://resolver.tudelft.nl/uuid:199e6f5f-2ec3-477c-a04a-045afb4379ed
DOI
https://doi.org/10.1109/ted.2015.2432572
TNO identifier
534090
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISSN
0018-9383
Source
IEEE Transactions on Electron Devices, 63 (1), 197-204
Article number
7117383
Document type
article