Title
A comprehensive model for transient behavior of tapping mode atomic force microscope
Author
Keyvani Janbahan, A.
Tamer, M.S.
van Wingerden, J.W.
Goosen, J.F.L.
van Keulen, F.
Publication year
2019
Abstract
Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode atomic force microscopy (TM-AFM). However, a transient dynamic model?which is essential for a model-based control design?is still missing. In this paper, we derive a mathematical model which covers both the transient and steady-state behavior. The steady-state response of the proposed model has been validated with existing theories. Its transient response, however, which is not covered with existing theories, has been successfully verified with experiments. Besides enabling model-based control design for TM-AFM, this model can explain the high-end aspects of AFM such as speed limitation, image quality, and eventual chaotic behavior.
Subject
High Tech Systems & Materials
Industrial Innovation
Tapping mode AFM
Transient analysis
Modulated model
Chaos
Speed limit of AFM
Atomic force microscope
Microscopy
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http://resolver.tudelft.nl/uuid:0c6c7dbc-3c52-4a8f-8610-5d6fe0f5a5bc
DOI
https://doi.org/10.1007/s11071-019-05079-2
TNO identifier
868194
Publisher
Springer, New York
ISSN
0924-090X
Source
Nonlinear Dynamics
Document type
article